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Fault Diagnosis of Analog Integrated Circuits

eBook - Frontiers in Electronic Testing

Erschienen am 13.01.2006, Auflage: 1/2006
111,95 €
(inkl. MwSt.)

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Bibliografische Daten
ISBN/EAN: 9780387257433
Sprache: Englisch
Umfang: 182 S., 6.01 MB
E-Book
Format: PDF
DRM: Digitales Wasserzeichen

Beschreibung

Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.

Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits.

Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces .

Also contains problems that can be used as quiz or homework.

Inhalt

Fault and Fault Modelling.- Test Stimulus Generation.- Fault Diagnosis Methodology.- Design for Testability and Built-In Self-Test.

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